NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 1551-2021
Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method 硅单晶电阻率的测定 直排四探针法和直流两探针法
Issued Date:2021/5/21
Implemented Date:2021/12/1
Issued by:
The Standardization Administration of the People's Republic of China
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